sibsutisВестник СибГУТИThe Herald of the Siberian State University of Telecommunications and Information Science1998-6920СибГУТИ10.55648/1998-6920-2024-18-3-57-72sibsutis-833Research ArticleСтатьиОтказы интегральных схем, вызванные воздействием эффектов электромиграции и антенныIntegrated Circuits Failures Caused by Electromigration and Antenna Effectshttps://orcid.org/0000-0002-2974-0497ШубинВ. В.ShubinV. V.

Шубин Владимир Владимирович - к.т.н., доцент кафедры технической электроники СибГУТИ; начальник отдела по разработке аналоговых ИМС АО «НЗПП Восток».

630082, Новосибирск, ул. Дачная, 60

Vladimir V. Shubin - Cand. of Sci. (Engineering), assistant professor of the Department of Technical Electronics of SibSUTIS, Head of the Development of analog ICs of JSC "NZPP Vostok department".

630082, Novosibirsk, Dachnaya str., 60

shubin@nzpp.ruСибирский государственный университет телекоммуникаций и информатики (СибГУТИ)РоссияSiberian State University of Telecommunications and Information Science (SibSUTIS)Russian Federation2024120320241835772Copyright © Шубин В.В., 20242024Шубин В.В.Shubin V.V.Данная работа распространяется под лицензией Creative Commons Attribution 4.0.This work is licensed under a Creative Commons Attribution 4.0 License.https://vestnik.sibsutis.ru/jour/article/view/833

В статье представлены некоторые проблемы отказов работы интегральных схем (ИС) и их предотвращение на ранних этапах проектирования. Рассмотрены, обобщены и систематизированы вопросы, связанные с отказами ИС, вызванными воздействием эффектов электромиграции и антенны. В статье приведены некоторые примеры, которые могут быть использованы в практической деятельности при разработке ИС для повышения их надёжности с учётом современных тенденций развития в области микроэлектроники.

The paper describes some problems of operation failures of integrated circuits (ICs) and corresponding preventative measures at the early stages of design process. The issues related to the problems of IC failures caused by electromigration and antenna effect are considered, generalized and systematized. Some examples that can be used in practice when developing ICs to improve their reliability taking into account current trends in the microelectronics fields are presented.

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The authors declare that there are no conflicts of interest present.