Integrated Circuits Failures Caused by Electromigration and Antenna Effects
https://doi.org/10.55648/1998-6920-2024-18-3-57-72
Abstract
The paper describes some problems of operation failures of integrated circuits (ICs) and corresponding preventative measures at the early stages of design process. The issues related to the problems of IC failures caused by electromigration and antenna effect are considered, generalized and systematized. Some examples that can be used in practice when developing ICs to improve their reliability taking into account current trends in the microelectronics fields are presented.
About the Author
V. V. Shubin
Siberian State University of Telecommunications and Information Science (SibSUTIS)
Russian Federation
Russian Federation
Vladimir V. Shubin - Cand. of Sci. (Engineering), assistant professor of the Department of Technical Electronics of SibSUTIS, Head of the Development of analog ICs of JSC "NZPP Vostok department".
630082, Novosibirsk, Dachnaya str., 60
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Review
For citations:
Shubin V.V. Integrated Circuits Failures Caused by Electromigration and Antenna Effects. The Herald of the Siberian State University of Telecommunications and Information Science. 2024;18(3):57-72. (In Russ.) https://doi.org/10.55648/1998-6920-2024-18-3-57-72
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