Integrated Circuits Failures Caused by Electromigration and Antenna Effects

V. V. Shubin

The Herald of the Siberian State University of Telecommunications and Information Science
Vestnik SibGUTI

ISSN 1998-6920 (Print)

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Shubin V.V. Integrated Circuits Failures Caused by Electromigration and Antenna Effects. The Herald of the Siberian State University of Telecommunications and Information Science. 2024;18(3):57-72. (In Russ.) https://doi.org/10.55648/1998-6920-2024-18-3-57-72

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ISSN 1998-6920 (Print)

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About the Author

V. V. Shubin
Siberian State University of Telecommunications and Information Science (SibSUTIS)
Russian Federation

Vladimir V. Shubin - Cand. of Sci. (Engineering), assistant professor of the Department of Technical Electronics of SibSUTIS, Head of the Development of analog ICs of JSC "NZPP Vostok department".

630082, Novosibirsk, Dachnaya str., 60

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